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Atomic Force Microscopy
Low Temperature Microscopy
Measurement & Characterization Systems
Available in more than 60 Countries
Why Choose Nanomagnetics Instruments
Best Price
We offer you the best price/performance products in the industrial science.
Custom Made
There is always a possibility to do a custom touch to your system.
Engineering Support
30+ engineers are ready to support your project and help you to get the best results!
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Testimonials
"The LT-SHPM allows us to correlate magnetic signals, measured at spatial resolutions down to 100nm, with nanoscale topographic sample features while the hpSPM DSP controller permits very rapid scan rates and can simultaneously capture up to 16 imaging channels with 24 Bit resolution. This advanced capability has increasingly enabled us to start exploring the dynamic properties of vortices in type II superconductors and domain walls in ferromagnetic films, directly identify nanoscale pinning sites and extend imaging studies up to much higher magnetic fields."
Professor Simon Bending
University of Bath
"The LT-AFM/MFM system allows us to perform studies on functional materials to investigate magnetic, piezoelectric and morphological characteristics with nanoscale spatial resolution. The versatility of the system to switch between different measuring modes, and the possibility of working under applied magnetic fields, offers us the possibility to establish structure-property relationships, fundamental to the understanding, design, and use of materials. We are currently applying this technique to the study of vortices dynamics in layered superconductors, and the investigation of ferroelectric/ferromagnetic heterojunctions for spintronic applications."
Dr. Carmen Munuera
Material Science Institute of Madrid (ICMM-CSIC)
Associate Professor Özgür Özer
"We use the hpSPM controller to run a Scanning Probe Microscope in UHV with multiple acquisition channels. With a built-in Fiber Interferometer Controller, it particularly allows us to do simultaneous STM/AFM measurements on various surfaces with atomic resolution. Fine control of the fiber-cantilever distance increases the sensitivity in the detection of cantilever deflection. This permits the use of sub-Ångström oscillation amplitudes which is crucial for quantitative force measurements and true simultaneous measurement of forces and tunnel currents."
Istanbul Technical University
