LT-sSNOM | Low Temperature Microscope
LT-sSNOM has the capability of near-field imaging and spectroscopy together with other AFM modes such as contact, dynamic, MFM, cAFM, KPFM, PRFM. The tip-sample interface is illuminated by off axis parabolic mirror and scattered light is detected by heterodyne interferometer.
Low Temperature Scattering Scanning Near-Field Optical Microscope
NanoMagnetics Instruments LT-sSNOM
LT-sSNOM has the capability of near-field imaging and spectroscopy together with other AFM modes such as contact, dynamic, MFM, cAFM, KPFM, PRFM. The tip-sample interface is illuminated by off axis parabolic mirror and scattered light is detected by heterodyne interferometer. A topographic image can be obtained simultaneously with an optical image.
Product Specifications
532nm - 20µm wavelength range with metallic mirrors
AFM with fiber interferometer
Piezo scanner, 30x30x15μm Scan area @4K
6x6x12mm Range XYZ Sample Nanopositioner
4x4x6mm Range XYZ Nanopositioner for Off Axis Parabolic mirror
200nm resolution resistive position sensors
49mm Outer Diameter
10mK to 300K temperature range
Up to 31T Magnetic Field
Sample holder with 8 electrical contacts
Contact/Dynamic/ ncAFM/MFM/cAFM/KPFM/PRFM/EFM modes