ezAFM+ | Atomic Force Microscope

Compact AFM with Electrical Modes

ezAFM+ is our compact atomic force microscopy system. We offer two different scan head options which are 40x40x4 µm or 120x120x40 µm.

This compact atomic force microscope can be integrated with inverted light microscopes or can be used in gloveboxes. The footprint of the controller is only 15×15 cm.

The samples can be moved manually or we can supply the optional motorized or manual sample stages. XY manual sample positioner has a 2×2 mm range with 10µm resolution and the XY motorized sample positioner has a 38×38 mm range with 1µm resolution.

Scanning modes

Contact Mode Dynamic Mode (Tapping Mode) Lateral Force Microscopy (LFM) Magnetic Force Microscopy (MFM) f-d Spectroscopy Piezo Response Force Microscopy Kelvin Probe Force Microscopy Conductive AFM Scanning Spreading Resistance Microscopy Lithography Liquid Modes

Optional AQUA(Liquid mode) Scan Head

We offer an optional AQUA scan head to operate the system in liquid mode. We are able to combine this feature with our ILM module as shown in the picture.

ILM system consists of 3 parts: ezAFM Scanner Head, XY Flexture Stage and ezAFM – ILM Adaptor Stage. The XY Flexture Stage moves the cantilever position with 2 mm range. Coaxial illumination is the top light source of the system, and except from ezAFM camera integrated inside of the ezAFM, the cantilever and also the sample can be observed from the ILM. Coarse z movement stage is adjusted for thicker samples.

ROBUST & FLEXIBLE: The design of the ezAFM allows users to replace/exchange the scan heads easily, safely and frequently. Each system can have scan heads for different scan size, Z range or air/liquid mediums.

EASE-OF-USE: In most commercial AFMs, replacement of the cantilever can be a daunting task for the user as it involves realigning the laser and photodiode after each cantilever exchange. Nanomagnetics Instruments Limited has made this routine simple and easy by utilising the fact that there is a vast range of commercially available cantilevers which have alignment grooves on the back side of the chip. Specially designed ‘alignment chips’ are incorporated in the design of our scanner heads, in such manner, that when the cantilevers are mounted, they will locate in the exactly the same position with respect to the laser beam thereby eliminating the need realign the laser or the photodiode.

COMPACT & PORTABLE: With a footprint of only 70cm x 30cm (including the laptop), the ezAFM requires little operating space. It is light and comes packed in a durable pelican case for easy transportation or storage. The microscope can also be placed in a glovebox in situations where enhanced environmental control is required.

VERSATILE: NanoMagnetics Instruments offers two different scan heads for the ezAFM for operation in ambient conditions. The ezAFM120 scan head has a maximum scan area up to 120x120x40µm and is best suited for samples with rough surfaces and it provides a 0.2 nm resolution in Z. The 40um Z range is much larger than that offered by most commercial systems allowing for imaging of a greater range of corrugated sample like textiles, fibres and paper pulp. The ezAFM40 scan head, on the other hand, has a maximum scan area is 40x40x4µm and with a 0.02nm resolution (in Z), which will allow you to scan single layer graphene surfaces. Additionally, although the typical sample size for the ezAFM is 10x10x5 mm, it can be easily reconfigured to images very large surfaces.